English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Surface-sensitive reflection-mode EXAFS from layered sample systems: The influence of surface and interface roughness

Keil, P., & Lützenkirchen-Hecht, D. (2009). Surface-sensitive reflection-mode EXAFS from layered sample systems: The influence of surface and interface roughness. J. Synchrotron Rad., 16, 443-443.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Keil, P.1, Author           
Lützenkirchen-Hecht, D., Author
Affiliations:
1Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863353              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 498835
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: J. Synchrotron Rad.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 16 Sequence Number: - Start / End Page: 443 - 443 Identifier: -