Fast low-cost phase detection setup for tapping-mode atomic force microscopy

Stark, M.; Guckenberger, R.

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Fast low-cost phase detection setup for tapping-mode atomic force microscopy

Stark, M., & Guckenberger, R. (1999). Fast low-cost phase detection setup for tapping-mode atomic force microscopy. Review of Scientific Instruments, 70(9), 3614-3619.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-71B5-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-71B6-A

Genre: Journal Article

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Stark, M., Author
Guckenberger, R.¹, Author

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1External Organizations, ou_persistent22

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Free keywords: ** scanning probe microscopy; energy-dissipation;; polymer surfaces; resolution; friction; domains; afm;

Abstract: MPIBIO: ASCA-Processing week 37/99; copyright ISI

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Dates: Date issued: 1999

Publication Status: Issued

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Identifiers: eDoc: 318651

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Title: Review of Scientific Instruments

Source Genre: Journal

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Pages: - Volume / Issue: 70 (9) Sequence Number: - Start / End Page: 3614 - 3619 Identifier: -