Grain boundary segregation in multicrystalline Silicon studied by correlative 
microscopy

Stoffers, Andreas

Local TagsRelease HistoryDetailsSummary

Grain boundary segregation in multicrystalline Silicon studied by correlative microscopy

Stoffers, A. (2017). Grain boundary segregation in multicrystalline Silicon studied by correlative microscopy. PhD Thesis, RWTH Aachen, Aachen, Germany.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/21.11116/0000-0000-3CFE-0 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-3CFF-F

Genre: Thesis

Files

show Files

Locators

show

Creators

show

hide

Creators:
Stoffers, Andreas¹, Author
Raabe, Dierk¹, Referee
Mayer, Joachim², Referee
Schneider, Jochen Michael³, Referee

Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
2Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany, ou_persistent22
3Materials Chemistry, Lehrstuhl für Werkstoffchemie, RWTH Aachen, Germany, ou_persistent22

Content

show

Details

show

hide

Language(s): eng - English

Dates: Accepted: 2017-05-19

Publication Status: Accepted / In Press

Pages: -

Publishing info: Aachen, Germany : RWTH Aachen

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: PhD

Event

show

Legal Case

show

Project information

show

Source

show