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  A method for direct determination of the prevailing counterion distribution at a charged surface

Koelsch, P., & Motschmann, H. (2004). A method for direct determination of the prevailing counterion distribution at a charged surface. The Journal of Physical Chemistry B, 108(48), 18659-18664. doi:10.1021/jp034890r.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-5F62-0 Version Permalink: https://hdl.handle.net/21.11116/0000-0006-4C6A-F
Genre: Journal Article

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Article.pdf (Publisher version), 105KB
 
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 Creators:
Koelsch, P.1, Author           
Motschmann, H.1, Author           
Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287              

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Language(s): eng - English
 Dates: 2004-12-02
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 210969
ISI: 000225417200037
DOI: 10.1021/jp034890r
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Title: The Journal of Physical Chemistry B
  Other : J. Phys. Chem. B
Source Genre: Journal
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Publ. Info: Washington, D.C. : American Chemical Society
Pages: - Volume / Issue: 108 (48) Sequence Number: - Start / End Page: 18659 - 18664 Identifier: ISSN: 1520-6106