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  Oxygen off-stoichiometry and phase separation in EuO thin films

Altendorf, S. G., Efimenko, A., Oliana, V., Kierspel, H., Rata, A. D., & Tjeng, L. H. (2011). Oxygen off-stoichiometry and phase separation in EuO thin films. Physical Review B, 84(15): 155442, pp. 155442-1-155442-9. doi:10.1103/PhysRevB.84.155442.

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 Creators:
Altendorf, S. G.1, Author           
Efimenko, A.2, Author           
Oliana, V.2, Author           
Kierspel, H., Author
Rata, A. D.3, Author           
Tjeng, L. H.4, Author           
Affiliations:
1Simone Altendorf, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863458              
2Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404              
3Diana Rata, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863449              
4Liu Hao Tjeng, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863452              

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Language(s): eng - English
 Dates: 2011-10-28
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 573772
DOI: 10.1103/PhysRevB.84.155442
 Degree: -

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Title: Physical Review B
Source Genre: Journal
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Pages: - Volume / Issue: 84 (15) Sequence Number: 155442 Start / End Page: 155442-1 - 155442-9 Identifier: ISSN: 1098-0121