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  Electronic structure investigations of Ni and Cr films on (100)SrTiO3 substrates using electron energy-loss spectroscopy

van Benthem, K., Scheu, C., Sigle, W., & Rühle, M. (2002). Electronic structure investigations of Ni and Cr films on (100)SrTiO3 substrates using electron energy-loss spectroscopy. Zeitschrift für Metallkunde, 93(5), 362-371.

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Genre: Journal Article
Alternative Title : Z. Metallk.

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1-ru_2002.doc.doc (Abstract), 20KB
 
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 Creators:
van Benthem, K.1, Author           
Scheu, C.1, Author           
Sigle, W.1, 2, Author           
Rühle, M.1, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Abt. Rühle; 1-ru_2002; electron energy-loss spectroscopy (EELS); electron energy-loss near-edge structures (ELNES); electronic structure; metal/ceramic interfaces; thin films
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Language(s): eng - English
 Dates: 2002-05
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 6775
ISI: 000176310600004
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Title: Zeitschrift für Metallkunde
  Alternative Title : Z. Metallk.
Source Genre: Journal
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Pages: - Volume / Issue: 93 (5) Sequence Number: - Start / End Page: 362 - 371 Identifier: ISSN: 0044-3093