Electron diffraction-based techniques in the SEM: Do they give you everything 
you ever wanted to know about your sample?

Zaefferer, S.

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Electron diffraction-based techniques in the SEM: Do they give you everything you ever wanted to know about your sample?

Zaefferer, S. (2011). Electron diffraction-based techniques in the SEM: Do they give you everything you ever wanted to know about your sample?. Talk presented at XIVth ICEM. Wisła, Poland. 2011-06-29.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3136-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-3E5E-B

Genre: Talk

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Creators:
Zaefferer, S.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Created: 2011-06

Publication Status: Not specified

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Identifiers: eDoc: 626174

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Title: XIVth ICEM

Place of Event: Wisła, Poland

Start-/End Date: 2011-06-29

Invited: Yes

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