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  Insights into the structural, electronic, and magnetic properties of Fe2-xTixO3/Fe2O3 thin films with x=0.44 grown on Al2O3 (0001)

Dennenwaldt, T., Lübbe, M., Winklhofer, M., Müller, A., Döblinger, M., Nabi, H. S., et al. (2015). Insights into the structural, electronic, and magnetic properties of Fe2-xTixO3/Fe2O3 thin films with x=0.44 grown on Al2O3 (0001). Journal of Materials Science, 50(1), 122-137. doi:10.1007/s10853-014-8572-x.

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 Creators:
Dennenwaldt, Teresa1, Author           
Lübbe, Maike2, 3, Author           
Winklhofer, Michael2, 3, Author           
Müller, Alexander4, Author           
Döblinger, Markus4, Author           
Nabi, Hasan Sadat2, 5, Author           
Gandman, Maria6, Author           
Cohen-Hyams, Tzipi7, Author           
Kaplan, Wayne D.7, Author           
Moritz, Wolfgang2, 5, Author           
Pentcheva, Rossitza2, 5, Author           
Scheu, Christina8, Author           
Affiliations:
1Department of Chemistry and Center for NanoScience (CeNS), Ludwig-Maximilians-Universität München, Butenandtstrasse 5-11 (E), Munich, Germany, ou_persistent22              
2Department of Earth and Environmental Sciences, LMU Munich, Germany, ou_persistent22              
3Center for NanoScience (CeNS), Ludwig-Maximilians-Universität München, Butenandtstrasse 5-11 (E), Munich, Germany, ou_persistent22              
4Department of Chemistry and CeNS, Ludwig-Maximilians-Universität München, Butenandtstrasse 5-11 (E), Munich, Germany, ou_persistent22              
5Center for NanoScience (CeNS), Ludwig-Maximilians-Universität München, ou_persistent22              
6UC Berkeley, Department of Materials Science and Engineering, Berkeley, USA, ou_persistent22              
7Department of Materials Science and Engineering, Technion-Israel Institute of Technology, Haifa 32000, Israel, ou_persistent22              
8Department of Chemistry and Center for NanoScience (CeNS), Ludwig-Maximilians Universität München, Germany, ou_persistent22              

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Free keywords: ENERGY-LOSS-SPECTROSCOPY; SOLID SOLUTION SERIES; LAMELLAR MAGNETISM; X-RAY; REMANENT MAGNETIZATION; ILMENITE EXSOLUTION; EXCHANGE BIAS; HEMATITE; DIFFRACTION; ALPHA-FE2O3Materials Science;
 Abstract: The interface between hematite (alpha-(Fe2O3)-O-III) and ilmenite ((FeTiO3)-Ti-II), a weak ferrimagnet and an antiferromagnet, respectively, has been suggested to be strongly ferrimagnetic due to the formation of a mixed valence layer of Fe2+/Fe3+ (1: 1 ratio) caused by compensation of charge mismatch at the chemically abrupt boundary. Here, we report for the first time direct experimental evidence for a chemically distinct layer emerging at heterointerfaces in the hematite-Ti-doped-hematite system. Using molecular beam epitaxy, we have grown thin films (similar to 25 nm thickness) of alpha-Fe2O3 on alpha-Al2O3 (0001) substrates, which were capped with a similar to 25 nm thick Fe2-xTixO3 layer (x = 0.44). An additional 3 nm cap of alpha-Fe2O3 was deposited on top. The films were structurally characterized in situ with surface X-ray diffraction, which showed a partial low index orientation relationship between film and substrate in terms of the [0001] axis and revealed two predominant domains with (0001)(Fe2O3) vertical bar vertical bar (0001)(Al2O3,) one with [10 (1) over bar0](Fe2O3) vertical bar vertical bar [10 (1) over bar0](Al2O3), and a twin domain with [01 (1) over bar0](Fe2O3) vertical bar vertical bar [10 (1) over bar0]Al2O3. Electron energy loss spectroscopy profiles across the Fe2-xTixO3/Fe2O3 interface show that FeFe2+/Fe3+ ratios peak right at the interface. This strongly suggests the formation of a chemically distinct interface layer, which might also be magnetically distinct as indicated by the observed magnetic enhancement in the Fe2-xTixO3/alpha-Fe2O3/Al2O3 system compared to the pure alpha-Fe2O3/Al2O3 system.

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Language(s): eng - English
 Dates: 2015-01
 Publication Status: Issued
 Pages: 16
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: ISI: 000345077000015
DOI: 10.1007/s10853-014-8572-x
 Degree: -

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Title: Journal of Materials Science
  Abbreviation : JMS
Source Genre: Journal
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Publ. Info: New York, NY, USA : Springer
Pages: - Volume / Issue: 50 (1) Sequence Number: - Start / End Page: 122 - 137 Identifier: ISSN: 0022-2461
CoNE: https://pure.mpg.de/cone/journals/resource/954925415936_1