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  Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films

Dourdain, S., Bardeau, J. F., Colas, M., Smarsly, B., Mehdi, A., Ocko, B. M., et al. (2005). Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films. Applied Physics Letters, 86(11): 113108. doi:10.1063/1.1887821.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-5E00-1 Version Permalink: https://hdl.handle.net/21.11116/0000-0008-0927-3
Genre: Journal Article

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1928691.pdf (Publisher version), 133KB
 
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 Creators:
Dourdain, S., Author
Bardeau, J. F., Author
Colas, M., Author
Smarsly, B.1, Author           
Mehdi, A., Author
Ocko, B. M., Author
Gibaud, A., Author
Affiliations:
1Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863288              

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Language(s): eng - English
 Dates: 2005
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 255453
ISI: 000228050700088
DOI: 10.1063/1.1887821
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Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
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Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 86 (11) Sequence Number: 113108 Start / End Page: - Identifier: ISSN: 0003-6951