Characterization of internal interfaces in Cu(In,Ga)Se2 thin-film solar cells 
using correlative microscopy

Choi, Pyuck-Pa

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Characterization of internal interfaces in Cu(In,Ga)Se₂ thin-film solar cells using correlative microscopy

Choi, P.-P. (2013). Characterization of internal interfaces in Cu(In,Ga)Se₂ thin-film solar cells using correlative microscopy. Talk presented at IEEE – Photovoltaic Specialist Conference. Denver, CO, USA. 2013-06-08 - 2013-06-13.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-419F-2 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-41A0-B

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Urheber:
Choi, Pyuck-Pa¹, Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384