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  Face Reconstruction from a Small Number of Feature Points

Hwang, B., Blanz, V., Vetter, T., & Lee, S. (2000). Face Reconstruction from a Small Number of Feature Points. In 15th International Conference on Pattern Recognition: ICPR-2000 (pp. 842-845). Los Alamitos, CA, USA: IEEE Computer Society.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0013-E461-9 Version Permalink: https://hdl.handle.net/21.11116/0000-0005-B5A1-8
Genre: Conference Paper

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https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=906205 (Publisher version)
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 Creators:
Hwang, BW, Author
Blanz, V1, 2, Author           
Vetter, T1, 2, Author           
Lee, SW, Author
Affiliations:
1Department Human Perception, Cognition and Action, Max Planck Institute for Biological Cybernetics, Max Planck Society, ou_1497797              
2Max Planck Institute for Biological Cybernetics, Max Planck Society, Spemannstrasse 38, 72076 Tübingen, DE, ou_1497794              

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 Abstract: This paper proposes a method for face reconstruction that makes use of only a small set of feature points. Faces can be modeled by forming linear combinations of prototypes of shape and texture information. With the shape and future information at the feature points alone, we can achieve only an approximation to the deformation required. In such an underdetermined condition, we find an optimal solution using a simple least square minimization method. As experimental results, we show well-reconstructed 2D faces even from a small number of feature points.

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 Dates: 2000-09
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1109/ICPR.2000.906205
BibTex Citekey: 1879
 Degree: -

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Title: 15th International Conference on Pattern Recognition (ICPR 2000)
Place of Event: Barcelona, Spain
Start-/End Date: 2000-09-03 - 2000-09-07

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Title: 15th International Conference on Pattern Recognition: ICPR-2000
Source Genre: Proceedings
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Publ. Info: Los Alamitos, CA, USA : IEEE Computer Society
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 842 - 845 Identifier: ISBN: 0-7695-0750-6