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  Analysis of the interface fracture resistance of multi-layered thin film structures under various service conditions

Soler, R., Venkatesan, S., Heinz, W., Roth, R., Nelhiebel, M., Fugger, J., et al. (2015). Analysis of the interface fracture resistance of multi-layered thin film structures under various service conditions. Talk presented at ESMC2015. Madrid, Spain. 2015-07-06 - 2015-07-10.

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 Creators:
Soler, Rafael1, Author           
Venkatesan, Sriram2, Author           
Heinz, Walther3, Author           
Roth, R.4, Author           
Nelhiebel, Michael5, Author           
Fugger, J.5, Author           
Kirchlechner, Christoph1, Author           
Dehm, Gerhard6, Author           
Affiliations:
1Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              
2Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
3Kompetenzzentrum Automobil- und Industrie-Elektronik GmbH, A-9524 Villach, Austria, ou_persistent22              
4Infineon Technologies AG, 9500 Villach, Austria, ou_persistent22              
5Kompetenzzentrum für Automobil und Industrieelektronik (KAI), Villach, Austria, ou_persistent22              
6Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2015-07
 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: ESMC2015
Place of Event: Madrid, Spain
Start-/End Date: 2015-07-06 - 2015-07-10

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