Structure of Copper/Sapphire Interfaces

Dehm, Gerhard; Rühle, Manfred; Ding, G.; Raj, Rishi

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Structure of Copper/Sapphire Interfaces

Dehm, G., Rühle, M., Ding, G., & Raj, R. (1994). Structure of Copper/Sapphire Interfaces. In B. Jouffrey (Ed.), Electron Microscopy 1994: Proceedings of the 13th International Congress on Electron Microscopy, Applications in Materials Sciences (pp. 277-278). Les Editions de Physique; 1994.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-996A-C Version Permalink: https://hdl.handle.net/21.11116/0000-0001-996B-B

Genre: Conference Paper

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Creators:
Dehm, Gerhard¹, Author
Rühle, Manfred², Author
Ding, G.³, Author
Raj, Rishi³, Author

Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
3Department of Materials Science and Engineering, Cornell University, Bard Hall, Ithaca, NY, 14853-1501, USA, persistent22

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Language(s): eng - English

Dates: Date issued: 1994

Publication Status: Issued

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Title: 13th International Congress on Electron Microscopy

Place of Event: Paris, France

Start-/End Date: 1994-07-17 - 1994-07-22

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Title: Electron Microscopy 1994 : Proceedings of the 13th International Congress on Electron Microscopy, Applications in Materials Sciences

Source Genre: Proceedings

Creator(s):
Jouffrey, B.¹, Editor
Colliex, C., Author

Affiliations:
1 Editions Physique, Avenue du Hoggar, Zone Industrielle Courtaboeuf, BP112 91944 Les Ulis, France, ou_persistent22

Publ. Info: Les Editions de Physique; 1994

Pages: - Volume / Issue: 2A-2B Sequence Number: - Start / End Page: 277 - 278 Identifier: -