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  Ba6Ge25: low-temperature Ge-Ge bond breaking during temperature-induced structure transformation

Carrillo-Cabrera, W., Borrmann, H., Paschen, S., Baenitz, M., Steglich, F., & Grin, Y. (2005). Ba6Ge25: low-temperature Ge-Ge bond breaking during temperature-induced structure transformation. Journal of Solid State Chemistry, 178(3), 715-728. doi:10.1016/j.jssc.2004.11.011.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2C22-1 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-3C71-E
Genre: Journal Article

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 Creators:
Carrillo-Cabrera, W.1, Author           
Borrmann, H.2, Author           
Paschen, S.3, Author           
Baenitz, M.4, Author           
Steglich, F.5, Author           
Grin, Y.6, Author           
Affiliations:
1Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863405              
2Horst Borrmann, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863410              
3Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404              
4Michael Baenitz, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863471              
5Frank Steglich, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863467              
6Juri Grin, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863413              

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Free keywords: Ba6Ge25; phase transition; reconstructive transformation; split sites; Ge-Ge bond breaking; lone-pairs; dangling bonds; binary Ba-Ge system
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Language(s): eng - English
 Dates: 2005-03
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 228689
ISI: 000227920000017
DOI: 10.1016/j.jssc.2004.11.011
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Title: Journal of Solid State Chemistry
  Alternative Title : J. Solid State Chem.
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 178 (3) Sequence Number: - Start / End Page: 715 - 728 Identifier: ISSN: 0022-4596