Correlated and simulated electron microscopy and atom probe tomography

Raabe, Dierk; Gault, Baptiste; Yao, Mengji; Scheu, Christina; Liebscher, Christian; Herbig, Michael

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Correlated and simulated electron microscopy and atom probe tomography

Raabe, D., Gault, B., Yao, M., Scheu, C., Liebscher, C., & Herbig, M. (2017). Correlated and simulated electron microscopy and atom probe tomography. Talk presented at Workshop on Possibilities and Limitations of Quantitative Materials Modeling and Characterization 2017. Bernkastel, Germany. 2017-05-16.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-86A8-1 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-6CEA-F

Genre: Talk

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Creators:
Raabe, Dierk¹, Author
Gault, Baptiste², Author
Yao, Mengji¹, Author
Scheu, Christina³, Author
Liebscher, Christian⁴, Author
Herbig, Michael⁵, Author

Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
3Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
4Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399
5Materials Science of Mechanical Contacts, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2324693

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Language(s): eng - English

Dates: Created: 2017-05-16

Publication Status: Not specified

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Title: Workshop on Possibilities and Limitations of Quantitative Materials Modeling and Characterization 2017

Place of Event: Bernkastel, Germany

Start-/End Date: 2017-05-16

Invited: Yes

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