Dislocation imaging by electron channeling contrast under controlled 
diffraction conditions in the SEM

Gutierrez-Urrutia, I.; Raabe, D.

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Dislocation imaging by electron channeling contrast under controlled diffraction conditions in the SEM

Gutierrez-Urrutia, I., & Raabe, D. (2011). Dislocation imaging by electron channeling contrast under controlled diffraction conditions in the SEM. Talk presented at Microscopy Conference MC 2011. Kiel, Germany. 2011-08-28 - 2011-09-02.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-304F-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3051-4

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Creators:
Gutierrez-Urrutia, I.¹, Author
Raabe, D.¹, Author

Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 572700

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Title: Microscopy Conference MC 2011

Place of Event: Kiel, Germany

Start-/End Date: 2011-08-28 - 2011-09-02

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