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  Ionization and charge migration through strong internal fields in clusters exposed to intense x-ray pulses

Gnodtke, C., Saalmann, U., & Rost, J. M. (2009). Ionization and charge migration through strong internal fields in clusters exposed to intense x-ray pulses. Physical Review A, 79(4): 041201.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-9281-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-9296-3
Genre: Journal Article

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 Creators:
Gnodtke, C.1, Author           
Saalmann, U.1, Author           
Rost, J. M.1, Author           
Affiliations:
1Max Planck Institute for the Physics of Complex Systems, Max Planck Society, ou_2117288              

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 MPIPKS: Light-matter interaction
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Language(s): eng - English
 Dates: 2009-04
 Publication Status: Issued
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 Rev. Type: -
 Identifiers: eDoc: 452598
ISI: 000265946900009
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Title: Physical Review A
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 79 (4) Sequence Number: 041201 Start / End Page: - Identifier: ISSN: 1050-2947