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  Strong optical anisotropies of F16CuPc thin films studied by spectroscopic ellipsometry

Alonso, M. I., Garriga, M., Osso, J. O., Schreiber, F., Barrena, E., & Dosch, H. (2003). Strong optical anisotropies of F16CuPc thin films studied by spectroscopic ellipsometry. Journal of Chemical Physics, 119(12), 6335-6340.

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 Creators:
Alonso, M. I.1, Author
Garriga, M.1, Author
Osso, J. O.2, Author           
Schreiber, F.3, Author           
Barrena, E.2, Author           
Dosch, H.2, 4, Author           
Affiliations:
1Institut de Ciència de Materials de Barcelona, CSIC, Campus de la UAB, 08193 Bellaterra, Spain; Institut für Theoretische und Angewandte Physik, Universität Stuttgart, 70569 Stuttgart, Germany, ou_persistent22              
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              
3Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
4Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Dosch;
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Language(s): eng - English
 Dates: 2003-09-22
 Publication Status: Issued
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 Rev. Type: -
 Identifiers: eDoc: 49858
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Title: Journal of Chemical Physics
Source Genre: Journal
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Pages: - Volume / Issue: 119 (12) Sequence Number: - Start / End Page: 6335 - 6340 Identifier: -