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  Self-assembled silane monolayers: An efficient step-by-step recipe for high-quality, low energy surfaces

Lessel, M., Bäumchen, O., Klos, M., Hähl, H., Fetzer, R., Paulus, M., Seemann, R., & Jacobs, K. (2015). Self-assembled silane monolayers: An efficient step-by-step recipe for high-quality, low energy surfaces. Surface and Interface Analysis, 47(5), 557-564. doi:10.1002/sia.5729.

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資料種別: 学術論文

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 作成者:
Lessel, Matthias, 著者
Bäumchen, Oliver1, 著者           
Klos, Mischa, 著者
Hähl, Hendrik, 著者
Fetzer, Renate, 著者
Paulus, Michael, 著者
Seemann, Ralf2, 著者           
Jacobs, Karin, 著者
所属:
1Group Dynamics of fluid and biological interfaces, Department of Dynamics of Complex Fluids, Max Planck Institute for Dynamics and Self-Organization, Max Planck Society, DE, ou_2063300              
2Group Geometry of Fluid Interfaces, Department of Dynamics of Complex Fluids, Max Planck Institute for Dynamics and Self-Organization, Max Planck Society, DE, ou_2063311              

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 要旨: Organosilane self-assembled monolayers (SAMs) are commonly used for modifying a wide range of substrates. Depending on the end group, highly hydrophobic or hydrophilic surfaces can be achieved. Silanization bases on the adsorption, self-assembly and covalent binding of silane molecules onto surfaces and results in a densely packed, SAM. Following wet chemical routines, the quality of the monolayer is often variable and, therefore, unsatisfactory. The process of self-assembly is not only affected by the chemicals involved and their purity but is also extremely sensitive to ambient parameters such as humidity or temperature and to contaminants. Here, a reliable and efficient wet-chemical recipe is presented for the preparation of ultra-smooth, highly ordered alkyl-terminated silane SAMs on Si wafers. The resulting surfaces are characterized by means of atomic force microscopy, X-ray reflectometry and contact angle measurements.

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言語: eng - English
 日付: 2015-02-132015-05
 出版の状態: 出版
 ページ: -
 出版情報: -
 目次: -
 査読: 査読あり
 識別子(DOI, ISBNなど): DOI: 10.1002/sia.5729
BibTex参照ID: lessel-sia-2015
 学位: -

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出版物名: Surface and Interface Analysis
種別: 学術雑誌
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出版社, 出版地: New York, NY : Wiley
ページ: - 巻号: 47 (5) 通巻号: - 開始・終了ページ: 557 - 564 識別子(ISBN, ISSN, DOIなど): ISSN: 0142-2421
CoNE: https://pure.mpg.de/cone/journals/resource/954925471358