A novel view on fatigue damage at the micron scale by in situ X-ray µLaue 
diffraction

Kirchlechner, Christoph; Motz, Christian; Imrich, Peter Julian; Dehm, Gerhard

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A novel view on fatigue damage at the micron scale by in situ X-ray µLaue diffraction

Kirchlechner, C., Motz, C., Imrich, P. J., & Dehm, G. (2014). A novel view on fatigue damage at the micron scale by in situ X-ray µLaue diffraction. Talk presented at TMS2014. San Diego, CA, USA. 2014-02-16 - 2014-02-20.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-001A-2B22-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-AB00-1

Genre: Talk

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Creators:
Kirchlechner, Christoph^{1, 2}, Author
Motz, Christian^{3, 4}, Author
Imrich, Peter Julian⁵, Author
Dehm, Gerhard^{1, 6}, Author

Affiliations:
1Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22
2Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401
3Department of Materials Science, Saarland University, Saarbrücken, Germany, ou_persistent22
4Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22
5Erich-Schmid-Institute of Materials Science, Austrian Academy of Sciences, Jahnstrasse 12, 8700 Leoben, Austria, ou_persistent22
6Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398

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Language(s): eng - English

Dates: Created: 2014

Publication Status: Not specified

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Title: TMS2014

Place of Event: San Diego, CA, USA

Start-/End Date: 2014-02-16 - 2014-02-20

Invited: Yes

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