ausblenden:
Schlagwörter:
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Zusammenfassung:
High precision electron probe microanalysis (EPMA) has been used to
measure the correlation of oxygen deficiency with carrier concentration
in thin films of amorphous indium oxide. This has shown that there are
ten times as many oxygen vacancies as would be expected from the carrier
concentration measurements, giving a doping efficiency of 0.1. It is
therefore clear that the doping mechanism is more complex than the usual
picture of every oxygen vacancy producing two free electrons.
