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  State-of-the-art attosecond metrology

Schultze, M., Wirth, A., Grguras, I., Uiberacker, M., Uphues, T., Verhoef, A. J., et al. (2011). State-of-the-art attosecond metrology. Journal of Electron Spectroscopy and Related Phenomena, 184(3-6 Sp. Iss. Sp. Iss. SI), 68-77. doi:10.1016/j.elspec.2011.01.003.

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4169.pdf (Publisher version), 2MB
 
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 Creators:
Schultze, Martin1, Author           
Wirth, Adrian2, 3, Author           
Grguras, Ivanka4, Author           
Uiberacker, Matthias4, Author           
Uphues, Thorsten2, Author           
Verhoef, Aart J.4, Author           
Gagnon, Justin4, Author           
Hofstetter, M., Author
Kleineberg, U.4, Author           
Goulielmakis, Eleftherios3, Author           
Krausz, Ferenc4, Author           
Affiliations:
1Attosecond Dynamics, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445573              
2Attosecond Imaging, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445574              
3Attoelectronics, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445572              
4Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564              

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Language(s): eng - English
 Dates: 2011-04
 Publication Status: Issued
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 Rev. Type: Peer
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Title: Journal of Electron Spectroscopy and Related Phenomena
Source Genre: Journal
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Pages: - Volume / Issue: 184 (3-6 Sp. Iss. Sp. Iss. SI) Sequence Number: - Start / End Page: 68 - 77 Identifier: -