3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning 
Electron Microscope: A New Dimension of Microstructure Characterisation

Zaefferer, S.; Konrad, J.; Raabe, D.

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3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning Electron Microscope: A New Dimension of Microstructure Characterisation

Zaefferer, S., Konrad, J., & Raabe, D. (2005). 3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning Electron Microscope: A New Dimension of Microstructure Characterisation. Talk presented at Microscopy Conference 2005. Davos, Switzerland. 2005-08-08 - 2005-09-02.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5ED1-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5ED3-0

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Creators:
Zaefferer, S.¹, Author
Konrad, J.^{1, 2}, Author
Raabe, D.³, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
2Development and Characterization of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

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Identifiers: eDoc: 292284

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Title: Microscopy Conference 2005

Place of Event: Davos, Switzerland

Start-/End Date: 2005-08-08 - 2005-09-02

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