FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM)

Hamou, R. F.; Biedermann, P. U.; Rohwerder, M.; Blumenau, A. T.

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FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM)

Hamou, R. F., Biedermann, P. U., Rohwerder, M., & Blumenau, A. T. (2008). FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM). Talk presented at Comsol European Conference 2008. Hannover, Germany. 2008-11-04 - 2008-11-06.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4571-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4573-F

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Creators:
Hamou, R. F.¹, Author
Biedermann, P. U.², Author
Rohwerder, M.^{1, 3}, Author
Blumenau, A. T.², Author

Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360
2Atomistic Modelling in Interface Science, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863351
3Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352

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Language(s): eng - English

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Identifiers: eDoc: 372735

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Title: Comsol European Conference 2008

Place of Event: Hannover, Germany

Start-/End Date: 2008-11-04 - 2008-11-06

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