Microstructural characterization of Cr-doped (Bi,Sb)2Te3thin films

Tarakina, Nadezda V.; Schreyeck, S.; Duchamp, M.; Karczewski, G.; Gould, C.; Brunner, K.; Dunin-Borkowski, R.E.; Molenkamp, L.W.

doi:10.1039/c7ce00872d

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Microstructural characterization of Cr-doped (Bi,Sb)₂Te₃thin films

Tarakina, N. V., Schreyeck, S., Duchamp, M., Karczewski, G., Gould, C., Brunner, K., et al. (2017). Microstructural characterization of Cr-doped (Bi,Sb)₂Te₃thin films. CrystEngComm, 19(26), 3633-3639. doi:10.1039/c7ce00872d.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-F322-7 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-F323-6

Genre: Journal Article

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Tarakina, Nadezda V.¹, Author
Schreyeck, S., Author
Duchamp, M., Author
Karczewski, G., Author
Gould, C., Author
Brunner, K., Author
Dunin-Borkowski, R.E., Author
Molenkamp, L.W., Author

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1Nadezda V. Tarakina, Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_2522693

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Dates: Date issued: 2017

Publication Status: Issued

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Identifiers: URI: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85021992495&doi=10.1039%2fc7ce00872d&partnerID=40&md5=b20016d28ffd0662678a6f8a0b1e6ce4
DOI: 10.1039/c7ce00872d

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Title: CrystEngComm

Source Genre: Journal

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Pages: - Volume / Issue: 19 (26) Sequence Number: - Start / End Page: 3633 - 3639 Identifier: -