Testing Cyber-Physical Systems through Bayesian Optimization

Deshmukh, Jyotirmoy; Horvat, Marko; Jin, Xiaoqing; Majumdar, Rupak; Prabhu, Vinayak

doi:10.1145/3126521

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Testing Cyber-Physical Systems through Bayesian Optimization

Deshmukh, J., Horvat, M., Jin, X., Majumdar, R., & Prabhu, V. (2017). Testing Cyber-Physical Systems through Bayesian Optimization. ACM Transactions on Embedded Computing Systems, 16(5s): 170, pp. 1-18. doi:10.1145/3126521.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-E7CD-5 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-E7E5-9

Genre: Journal Article

Latex : Testing Cyber-Physical Systems through {B}ayesian Optimization

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Creators:
Deshmukh, Jyotirmoy¹, Author
Horvat, Marko², Author
Jin, Xiaoqing¹, Author
Majumdar, Rupak², Author
Prabhu, Vinayak², Author

Affiliations:
1External Organizations, ou_persistent22
2Group R. Majumdar, Max Planck Institute for Software Systems, Max Planck Society, ou_2105292

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Language(s): eng - English

Dates: Published Online: 2017Date issued: 2017

Publication Status: Issued

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Identifiers: BibTex Citekey: Deshmukh:2017:TCS:3145508.3126521
DOI: 10.1145/3126521

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Title: ACM Transactions on Embedded Computing Systems

Source Genre: Journal

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Publ. Info: New York, NY : ACM

Pages: - Volume / Issue: 16 (5s) Sequence Number: 170 Start / End Page: 1 - 18 Identifier: -