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  QHREM study on thermal stability of stacked self-assembled InP quantum dots

Jin-Phillipp, N. Y., Zundel, M., Du, K., Phillipp, F., & Eberl, K. (2001). QHREM study on thermal stability of stacked self-assembled InP quantum dots. In A. Cullis, & J. Hutchison (Eds.), Microscopy of Semiconducting Materials 2001 (pp. 93-96).

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 Creators:
Jin-Phillipp, N. Y.1, Author           
Zundel, M., Author
Du, K.1, Author           
Phillipp, F.1, Author           
Eberl, K., Author
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Free keywords: MPI für Metallforschung; Ehemalige Abt. Rühle; ZWE Hochspannungs-Mikroskopie; 52-ru_2002;
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Language(s): eng - English
 Dates: 2001
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 10972
ISI: 000174182400107
 Degree: -

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Title: Microscopy of Semiconducting Materials 2001
Place of Event: Oxford
Start-/End Date: 2001-03-25 - 2001-03-29

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Title: Microscopy of Semiconducting Materials 2001
Source Genre: Proceedings
 Creator(s):
Cullis, A.G., Editor
Hutchison, J.L., Editor
Affiliations:
-
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 93 - 96 Identifier: -

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Title: Institute of Physics conference series
Source Genre: Series
 Creator(s):
Institute of Physics, Editor              
Affiliations:
-
Publ. Info: -
Pages: - Volume / Issue: 169 Sequence Number: - Start / End Page: - Identifier: ISSN: 0021-8979