English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
 Local TagsRelease HistoryDetailsSummary
  Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction

Krewer, K. L., Mics, Z., Arabski, J., Schmerber, G., Beaurepaire, E., Bonn, M., et al. (2018). Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction. Optics Letters, 43(3), 447-450. doi:10.1364/OL.43.000447.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/21.11116/0000-0000-76F1-B Version Permalink: https://hdl.handle.net/21.11116/0000-0000-76F3-9
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Krewer, Keno L.1, Author           
Mics, Zoltan1, Author           
Arabski, J., Author
Schmerber, G., Author
Beaurepaire, E., Author
Bonn, Mischa1, Author           
Turchinovich, Dmitry1, Author           
Affiliations:
1Dept. Bonn: Molecular Spectroscopy, MPI for Polymer Research, Max Planck Society, ou_1800285              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2018
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1364/OL.43.000447
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Optics Letters
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Washington : Optical Society of America
Pages: - Volume / Issue: 43 (3) Sequence Number: - Start / End Page: 447 - 450 Identifier: ISSN: 0146-9592
CoNE: https://pure.mpg.de/cone/journals/resource/954925474435