Characterization of advanced functional and structural materials using Atom 
Probe Tomography

Choi, P.

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Characterization of advanced functional and structural materials using Atom Probe Tomography

Choi, P. (2011). Characterization of advanced functional and structural materials using Atom Probe Tomography. Talk presented at Inauguration symposium for the Atom Probe facilities ETH Zürich. Zürich, Switzerland. 2011-12-06.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2E73-3 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-4266-9

Genre: Vortrag

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Urheber:
Choi, P.¹, Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384