EELS and EFTEM studies at low energy losses and high energy resolution

Sigle, W.

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EELS and EFTEM studies at low energy losses and high energy resolution

Sigle, W. (2004). EELS and EFTEM studies at low energy losses and high energy resolution. In I. Anderson, R. Price, E. Hall, E. Clark, & S. McKernan (Eds.), Proceedings Microscopy and Microanalysis 2004, Suppl. 2 (pp. 258CD-259CD). New York, USA: Press Syndicate of the University of Cambridge.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2AE1-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2AE2-6

Genre: Conference Paper

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Creators:
Sigle, W.^{1, 2}, Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Metallforschung; Abt. Rühle;

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Language(s): eng - English

Dates: Date issued: 2004

Publication Status: Issued

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Rev. Type: Internal

Identifiers: eDoc: 194929

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Title: Microscopy and Microanalysis 2004

Place of Event: Savannah, Georgia, USA

Start-/End Date: 2004-08-01 - 2004-08-05

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Title: Proceedings Microscopy and Microanalysis 2004, Suppl. 2

Source Genre: Proceedings

Creator(s):
Anderson, I.M., Editor
Price, R., Editor
Hall, E., Editor
Clark, E., Editor
McKernan, S., Editor

Affiliations:
-

Publ. Info: New York, USA : Press Syndicate of the University of Cambridge

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 258CD - 259CD Identifier: -