Thickness dependent exchange bias in martensitic epitaxial Ni–Mn–Sn thin films

Behler, Anna; Teichert, Niclas; Dutta, Biswanath; Waske, Anja; Hickel, Tilmann; Auge, Alexander; Hütten, Andreas; Eckert, Jürgen

doi:10.1063/1.4849795

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Thickness dependent exchange bias in martensitic epitaxial Ni–Mn–Sn thin films

Behler, A., Teichert, N., Dutta, B., Waske, A., Hickel, T., Auge, A., et al. (2013). Thickness dependent exchange bias in martensitic epitaxial Ni–Mn–Sn thin films. AIP Advances, 3(12): 122112. doi:10.1063/1.4849795.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-B37A-2 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-B37F-7

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Urheber:
Behler, Anna^{1, 2}, Autor
Teichert, Niclas³, Autor
Dutta, Biswanath⁴, Autor
Waske, Anja¹, Autor
Hickel, Tilmann⁴, Autor
Auge, Alexander³, Autor
Hütten, Andreas³, Autor
Eckert, Jürgen^{1, 5}, Autor

Affiliations:
1IFW Dresden, Institute for Complex Materials, P.O. Box 27 01 16, 01171 Dresden, Germany, ou_persistent22
2Department of Physics, Institute for Solid State Physics, Dresden University of Technology, 01062 Dresden, Germany, ou_persistent22
3Department of Physics, Thin Films and Physics of Nanostructures, Bielefeld University, 33501 Bielefeld, Germany, ou_persistent22
4Computational Phase Studies, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863341
5TU Dresden, Institute of Materials Science, Helmholtzstr. 7, 01069 Dresden, Germany, ou_persistent22