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  Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy

Hamou, F. R., Biedermann, P. U., Erbe, A., & Rohwerder, M. (2010). Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy. Electrochimica Acta, 55(18), 5210-5222. doi:10.1016/j.electacta.2010.04.042.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-38C0-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-6B43-9
Genre: Journal Article

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 Creators:
Hamou, Fayçal Riad1, Author           
Biedermann, Paul Ulrich2, Author           
Erbe, Andreas3, Author           
Rohwerder, Michael1, Author           
Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360              
2Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863350              
3Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              

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Language(s): eng - English
 Dates: 2010-07-15
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 476016
DOI: 10.1016/j.electacta.2010.04.042
 Degree: -

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Title: Electrochimica Acta
  Abbreviation : Electrochim. Acta
Source Genre: Journal
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Publ. Info: Oxford, UK : Pergamon-Elsevier Science Ltd
Pages: - Volume / Issue: 55 (18) Sequence Number: - Start / End Page: 5210 - 5222 Identifier: ISSN: 0013-4686
CoNE: https://pure.mpg.de/cone/journals/resource/954925396434