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  Growth kinetics and mechanisms of aluminium-oxide films formed by thermal oxidation of aluminum

Jeurgens, L. P. H., Sloof, W. G., Tichelaar, F. D., & Mittemeijer, E. J. (2002). Growth kinetics and mechanisms of aluminium-oxide films formed by thermal oxidation of aluminum. Journal of Applied Physics, 92, 1649-1656.

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 Creators:
Jeurgens, L. P. H.1, Author           
Sloof, W. G., Author
Tichelaar, F. D., Author
Mittemeijer, E. J.1, 2, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer; 28-mi_2002;
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Language(s): eng - English
 Dates: 2002
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 13374
ISI: 000176089000017
 Degree: -

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Title: Journal of Applied Physics
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 92 Sequence Number: - Start / End Page: 1649 - 1656 Identifier: ISSN: 0039-6028