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  High-Precision Metrology of Highly Charged Ions via Relativistic Resonance Fluorescence

Postavaru, O., Harman, Z., & Keitel, C. H. (2011). High-Precision Metrology of Highly Charged Ions via Relativistic Resonance Fluorescence. Physical Review Letters, 106(3): 033001. doi:10.1103/PhysRevLett.106.033001.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0012-5F47-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0012-5F48-3
Genre: Journal Article

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http://link.aps.org/doi/10.1103/PhysRevLett.106.033001 (Publisher version)
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 Creators:
Postavaru, Octavian1, Author           
Harman, Zoltan1, Author           
Keitel, Christoph H.1, Author           
Affiliations:
1Division Prof. Dr. Christoph H. Keitel, MPI for Nuclear Physics, Max Planck Society, ou_904546              

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 Dates: 2011-01-18
 Publication Status: Issued
 Pages: 4 pages
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1103/PhysRevLett.106.033001
 Degree: -

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Title: Physical Review Letters
  Other : Phys. Rev. Lett.
Source Genre: Journal
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Publ. Info: Woodbury, N.Y., etc. : American Physical Society.
Pages: - Volume / Issue: 106 (3) Sequence Number: 033001 Start / End Page: - Identifier: ISSN: 0031-9007
CoNE: https://pure.mpg.de/cone/journals/resource/954925433406