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  Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device

Sakaue, H. A., Yamamoto, N., Morita, S., Nakamura, N., Chen, C., Kato, D., et al. (2011). Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device. Journal of Applied Physcis, 109(7): 073304. doi:10.1063/1.3549707.

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 Creators:
Sakaue, H. A.1, Author
Yamamoto, N.1, Author
Morita, S.1, Author
Nakamura, N.1, Author
Chen, C.1, Author
Kato, D.1, Author
Kikuchi, H.1, Author
Murakami, I.1, Author
Ohtani, S.1, Author
Tanuma, H.1, Author
Watanabe, T.1, Author
Tawara, Hiroyuki2, Author           
Affiliations:
1External Organizations, ou_persistent22              
2Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547              

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Free keywords: B-4945-2011
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 Dates: 20112011
 Publication Status: Issued
 Pages: 9
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: 000289949000019
DOI: 10.1063/1.3549707
 Degree: -

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Title: Journal of Applied Physcis
Source Genre: Journal
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Publ. Info: New York, NY : American Institute of Physics
Pages: - Volume / Issue: 109 (7) Sequence Number: 073304 Start / End Page: - Identifier: ISSN: 0021-8979
CoNE: https://pure.mpg.de/cone/journals/resource/991042723401880_1