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  Extracting Higher Order Critical Points and Topological Simplification of 3D Vector Fields

Weinkauf, T., Theisel, H., Shi, K., Hege, H.-C., & Seidel, H.-P. (2005). Extracting Higher Order Critical Points and Topological Simplification of 3D Vector Fields. In C. T. Silva, E. Gröller, & H. Rushmeier (Eds.), IEEE Visualization 2005 (pp. 559-566). Los Alamitos, USA: IEEE.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-267D-4 Version Permalink: https://hdl.handle.net/21.11116/0000-000F-3C31-7
Genre: Conference Paper

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 Creators:
Weinkauf, Tino1, Author
Theisel, Holger2, Author           
Shi, Kuangyu2, Author           
Hege, Hans-Christian1, Author
Seidel, Hans-Peter2, Author                 
Affiliations:
1External Organizations, ou_persistent22              
2Computer Graphics, MPI for Informatics, Max Planck Society, ou_40047              

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Language(s): eng - English
 Dates: 2006-04-252005
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 278965
Other: Local-ID: C125675300671F7B-C6C2757EF16879D8C1257050003CF30A-Weinkauf05
BibTex Citekey: Weinkauf-et-al_VIS05
DOI: 10.1109/VISUAL.2005.1532842
 Degree: -

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Title: 2005 IEEE Conference on Visualization
Place of Event: Minneapolis, MN, USA
Start-/End Date: 2005-10-23 - 2005-10-28

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Title: IEEE Visualization 2005
  Abbreviation : VIS 2005
Source Genre: Proceedings
 Creator(s):
Silva, Cláudio T.1, Editor
Gröller, Eduard1, Editor
Rushmeier, Holly1, Editor
Affiliations:
1 External Organizations, ou_persistent22            
Publ. Info: Los Alamitos, USA : IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 559 - 566 Identifier: ISBN: 0-7803-9462-3