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  Progress on the development of DEPFET based SDD and MPD detectors

Treis, J., Heinzinger, K., Hermenau, K., Herrmann, S., Lauf, T., Lechner, P., et al. (2011). Progress on the development of DEPFET based SDD and MPD detectors. Microscopy and Microanalysis, 17(Supplement 2), 1202-1203. doi:10.1017/S143192761100688X.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-4EEC-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-4EED-F
Genre: Conference Paper

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 Creators:
Treis, J., Author
Heinzinger, K., Author
Hermenau, K., Author
Herrmann, S., Author
Lauf, T.1, Author           
Lechner, P., Author
Lutz, G., Author
Majewski, P., Author
Porro, M., Author
Richter, R., Author
Schaller, G.1, Author           
Schopper, F.1, Author           
Soltau, H., Author
Strüder, L.1, Author           
de Vita, G.1, Author           
Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890              

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Language(s): eng - English
 Dates: 2011-10
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1017/S143192761100688X
Other: LOCALID: 1404671
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Title: Microscopy and Microanalysis 2011
Place of Event: Nashville, Tennessee, USA
Start-/End Date: 2011-08-07 - 2011-08-11

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Title: Microscopy and Microanalysis
Source Genre: Journal
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Pages: - Volume / Issue: 17 (Supplement 2) Sequence Number: - Start / End Page: 1202 - 1203 Identifier: ISSN: 1431-9276