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  Pressure Dependence of Thickness and Refractive Index of Thin PMMA-Films Investigated by Surface Plasmon and Optical Waveguide Spectroscopy

Kleideiter, G., Lechner, M. D., & Knoll, W. (1999). Pressure Dependence of Thickness and Refractive Index of Thin PMMA-Films Investigated by Surface Plasmon and Optical Waveguide Spectroscopy. Macromolecular Chemistry and Physics, 200, 1028-1033.

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 Creators:
Kleideiter, G.1, Author           
Lechner, M. D., Author
Knoll, Wolfgang1, Author           
Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545              

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Language(s): eng - English
 Dates: 1999
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 321433
Other: P-99-52
 Degree: -

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Title: Macromolecular Chemistry and Physics
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 200 Sequence Number: - Start / End Page: 1028 - 1033 Identifier: -