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  Refractive Index and Thickness Determination of Monolayers by Multi Mode Waveguide Coupled Surface Plasmons

Weisser, M., Menges, B., & Mittler-Neher, S. (1999). Refractive Index and Thickness Determination of Monolayers by Multi Mode Waveguide Coupled Surface Plasmons. Sensors and Actuators B-Chemical, 56, 189-197.

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 Creators:
Weisser, M.1, Author           
Menges, B.1, Author           
Mittler-Neher, Silvia1, Author           
Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545              

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Language(s): eng - English
 Dates: 1999
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 324427
Other: P-99-99
 Degree: -

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Title: Sensors and Actuators B-Chemical
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 56 Sequence Number: - Start / End Page: 189 - 197 Identifier: -