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  Determination of Micrometer Length Scales with an X-ray Reflection Ultra Small-Angle Scattering Set-Up

Müller-Buschbaum, P., Casagrande, M., Gutmann, J. S., Kuhlmann, T., Stamm, M., von Krosigk, G., et al. (1998). Determination of Micrometer Length Scales with an X-ray Reflection Ultra Small-Angle Scattering Set-Up. Europhysics Letters, 42, 517-522.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-000F-5603-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-000F-5604-D
Genre: Journal Article

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 Creators:
Müller-Buschbaum, P., Author
Casagrande, M.1, Author              
Gutmann, Jochen S.1, Author              
Kuhlmann, T.1, Author              
Stamm, Manfred1, Author              
von Krosigk, G., Author
Lode, U., Author
Cunis, S., Author
Gehrke, R., Author
Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545              

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Language(s): eng - English
 Dates: 1998
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 359301
Other: P-98-77
 Degree: -

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Title: Europhysics Letters
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 42 Sequence Number: - Start / End Page: 517 - 522 Identifier: -