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  The inverse electromechanical effect in mechanically oriented S-C*-elastomers examined by means of an ultra-stable Michelson interferometer

Lehmann, W., Gattinger, P., Keck, M., Kremer, F., Stein, P., Eckert, T., et al. (1998). The inverse electromechanical effect in mechanically oriented S-C*-elastomers examined by means of an ultra-stable Michelson interferometer. Ferroelectrics, 208(1-4), 373-383.

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 Creators:
Lehmann, W., Author
Gattinger, P., Author
Keck, M., Author
Kremer, F.1, Author              
Stein, P., Author
Eckert, T., Author
Finkelmann, H., Author
Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545              

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Language(s): eng - English
 Dates: 1998
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 564406
 Degree: -

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Title: Ferroelectrics
  Alternative Title : Ferroelectrics
Source Genre: Journal
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Pages: - Volume / Issue: 208 (1-4) Sequence Number: - Start / End Page: 373 - 383 Identifier: -