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  Static and dynamic profiles of tethered polymer layers probed by analyzing the noise of an atomic force microscope

Roters, A., Gelbert, M., Schimmel, M., Rühe, J., & Johannsmann, D. (1997). Static and dynamic profiles of tethered polymer layers probed by analyzing the noise of an atomic force microscope. Physical Review E, 56(3), 3256-3264.

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 Creators:
Roters, A., Author
Gelbert, M.1, Author              
Schimmel, M., Author
Rühe, Jürgen1, Author              
Johannsmann, Diethelm1, Author              
Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545              

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Language(s): eng - English
 Dates: 1997
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 362432
 Degree: -

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Title: Physical Review E
  Alternative Title : Phys. Rev. E
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 56 (3) Sequence Number: - Start / End Page: 3256 - 3264 Identifier: -