Multivariate characterization of ultra-thin nanofunctional plasma polymer films 
using ToF-SIMS analysis

von Gradowski, M.; Wahl, M.; Förch, Renate; Hilgers, H.

doi:10.1002/sia.1853

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Multivariate characterization of ultra-thin nanofunctional plasma polymer films using ToF-SIMS analysis

von Gradowski, M., Wahl, M., Förch, R., & Hilgers, H. (2004). Multivariate characterization of ultra-thin nanofunctional plasma polymer films using ToF-SIMS analysis. Surface and Interface Analysis, 36(8), 1114-1118. doi:10.1002/sia.1853.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-5FFE-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-C45F-E

Genre: Journal Article

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Creators:
von Gradowski, M., Author
Wahl, M., Author
Förch, Renate¹, Author
Hilgers, H., Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 2004

Publication Status: Issued

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Identifiers: eDoc: 204200
Other: P-04-203
DOI: 10.1002/sia.1853

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Title: Surface and Interface Analysis

Source Genre: Journal

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Publ. Info: New York, NY : John Wiley & Sons

Pages: - Volume / Issue: 36 (8) Sequence Number: - Start / End Page: 1114 - 1118 Identifier: ISSN: 0142-2421
CoNE: https://pure.mpg.de/cone/journals/resource/954925471358