English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Scanning microfocus small-angle X-ray scattering: A new tool to investigate defects at polymer-polymer interfaces

Lorenz-Haas, C., Müller-Buschbaum, P., Wunnicke, O., Cassignol, C., Burghammer, M., Riekel, C., et al. (2003). Scanning microfocus small-angle X-ray scattering: A new tool to investigate defects at polymer-polymer interfaces. Langmuir, 19(7), 3056-3061. doi:10.1021/la026693+.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-000F-6234-2 Version Permalink: http://hdl.handle.net/21.11116/0000-0002-18F5-F
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Lorenz-Haas, C.1, Author              
Müller-Buschbaum, P., Author
Wunnicke, O., Author
Cassignol, C.1, Author              
Burghammer, M., Author
Riekel, C., Author
Stamm, Manfred2, Author              
Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545              
2Inst Polymerforsch Dresden EV, D-01069 Dresden, Germany, ou_persistent22              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2003-04-01
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 28375
ISI: 000181980900074
Other: P-03-293
DOI: 10.1021/la026693+
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Langmuir
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Columbus, OH : American Chemical Society
Pages: - Volume / Issue: 19 (7) Sequence Number: - Start / End Page: 3056 - 3061 Identifier: ISSN: 0743-7463
CoNE: https://pure.mpg.de/cone/journals/resource/954925541194