X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a 
structured silicon wafer surface

Kubowicz, S.; Thünemann, A. F.; Geue, T. M.; Pietsch, U.; Watson, Mark D.; Tchebotareva, N.; Müllen, Klaus

doi:10.1021/la035210e

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X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface

Kubowicz, S., Thünemann, A. F., Geue, T. M., Pietsch, U., Watson, M. D., Tchebotareva, N., et al. (2003). X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface. Langmuir, 19(26), 10997-10999. doi:10.1021/la035210e.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-63D3-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-620A-5

Genre: Journal Article

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Creators:
Kubowicz, S.¹, Author
Thünemann, A. F., Author
Geue, T. M., Author
Pietsch, U., Author
Watson, Mark D.², Author
Tchebotareva, N.², Author
Müllen, Klaus², Author

Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287
2MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Identifiers: eDoc: 60538
Other: P-03-164
DOI: 10.1021/la035210e

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Title: Langmuir

Abbreviation : Langmuir

Source Genre: Journal

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Publ. Info: Columbus, OH : American Chemical Society

Pages: - Volume / Issue: 19 (26) Sequence Number: - Start / End Page: 10997 - 10999 Identifier: ISSN: 0743-7463
CoNE: https://pure.mpg.de/cone/journals/resource/954925541194