Derivation of the Shear Compliance of Thin Films on Quartz Resonators from 
Comparison of the Frequency Shifts on Different Harmonics: A Perturbation 
Analysis

Johannsmann, Diethelm

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Derivation of the Shear Compliance of Thin Films on Quartz Resonators from Comparison of the Frequency Shifts on Different Harmonics: A Perturbation Analysis

Johannsmann, D. (2001). Derivation of the Shear Compliance of Thin Films on Quartz Resonators from Comparison of the Frequency Shifts on Different Harmonics: A Perturbation Analysis. Journal of Applied Physics, 89, 6356-6364.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-6926-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-6927-4

Genre: Journal Article

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Johannsmann, Diethelm¹, Author

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1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 2001

Publication Status: Issued

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Identifiers: eDoc: 271546
Other: P-01-211

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Title: Journal of Applied Physics

Source Genre: Journal

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Pages: - Volume / Issue: 89 Sequence Number: - Start / End Page: 6356 - 6364 Identifier: -