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  Nanoelectronic Properties of a Model System and of a Conjugated Polymer: A Study by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode Microscopy

Sun, L., Wang, J. J., & Bonaccurso, E. (2010). Nanoelectronic Properties of a Model System and of a Conjugated Polymer: A Study by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode Microscopy. Journal of Physical Chemistry C, 114(15), 7161-7168.

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 Creators:
Sun, L.1, Author              
Wang, J. J.1, Author              
Bonaccurso, Elmar1, Author              
Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545              

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Language(s): eng - English
 Dates: 2010
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 475532
Other: P-10-239
 Degree: -

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Title: Journal of Physical Chemistry C
  Alternative Title : J. Phys. Chem. C
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 114 (15) Sequence Number: - Start / End Page: 7161 - 7168 Identifier: -