Nanoelectronic Properties of a Model System and of a Conjugated Polymer: A 
Study by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode 
Microscopy

Sun, L.; Wang, J. J.; Bonaccurso, Elmar

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Nanoelectronic Properties of a Model System and of a Conjugated Polymer: A Study by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode Microscopy

Sun, L., Wang, J. J., & Bonaccurso, E. (2010). Nanoelectronic Properties of a Model System and of a Conjugated Polymer: A Study by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode Microscopy. Journal of Physical Chemistry C, 114(15), 7161-7168.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-720E-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-00C2-9

Genre: Journal Article

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Creators:
Sun, L.¹, Author
Wang, J. J.¹, Author
Bonaccurso, Elmar¹, Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 2010

Publication Status: Issued

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Identifiers: eDoc: 475532
Other: P-10-239

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Title: Journal of Physical Chemistry C

Alternative Title : J. Phys. Chem. C

Source Genre: Journal

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Pages: - Volume / Issue: 114 (15) Sequence Number: - Start / End Page: 7161 - 7168 Identifier: -