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  Electrical Scanning Probe Microscopy of an Integrated Blocking Layer

Weber, S. A. L., Memesa, M., Berger, R., Butt, H.-J., & Gutmann, J. S. (2010). Electrical Scanning Probe Microscopy of an Integrated Blocking Layer. Journal of Nanoscience and Nanotechnology, 10(10), 6840-6844.

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 Creators:
Weber, S. A. L.1, Author              
Memesa, M.1, Author              
Berger, Rüdiger1, Author              
Butt, Hans-Jürgen1, Author              
Gutmann, Jochen S.1, Author              
Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545              

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Language(s): eng - English
 Dates: 2010
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 493351
Other: P-10-116
 Degree: -

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Title: Journal of Nanoscience and Nanotechnology
  Alternative Title : J. Nanosci. Nanotechnol.
Source Genre: Journal
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 10 (10) Sequence Number: - Start / End Page: 6840 - 6844 Identifier: -