Oscillation-induced static deflection in scanning force microscopy

Heim, Lars-Oliver; Johannsmann, Diethelm

doi:10.1063/1.2424445

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Oscillation-induced static deflection in scanning force microscopy

Heim, L.-O., & Johannsmann, D. (2007). Oscillation-induced static deflection in scanning force microscopy. Review of Scientific Instruments, 78(1): 013902. doi:10.1063/1.2424445.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-7C4B-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-93D7-7

Genre: Journal Article

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Creators:
Heim, Lars-Oliver¹, Author
Johannsmann, Diethelm², Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545
2Clausthal Univ Technol, Inst Phys Chem, D-38678 Clausthal Zellerfeld, Germany, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 2007

Publication Status: Issued

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Identifiers: eDoc: 300346
Other: P-07-44
DOI: 10.1063/1.2424445

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Title: Review of Scientific Instruments

Source Genre: Journal

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Publ. Info: Melville, NY : AIP Publishing

Pages: - Volume / Issue: 78 (1) Sequence Number: 013902 Start / End Page: - Identifier: ISSN: 0034-6748
CoNE: https://pure.mpg.de/cone/journals/resource/991042742033452